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ISSN Online: 2377-424X

International Heat Transfer Conference 12
August, 18-23, 2002, Grenoble, France

Thermal Radiation Spectroscopy for Heat Transfer Science and for Engineering Surface Diagnosis

Get access (open in a dialog) DOI: 10.1615/IHTC12.3140
12 pages

要約

Microstructure of solid surfaces can change dynamically in crude industrial environments. Also, the surface microstructure can be processed positively to realize various functions on the surfaces. Such surface changes affect the spectral characteristics of thermal radiation extensively, and the spectral change reflects the information on surface microstructure sensitively. For the modern heat transfer evaluation, a list of universal property values for radiation on various surfaces is rather less valuable, but any systematic knowledge on the spectral transition phenomena is required. The spectral region should be wide enough to cover the Planckian distribution region from the visible through the infrared. New ideas for the hard- and soft-wares for thermal radiation study should be presented now. Radiation spectroscopy dealing with the wide spectral region and the time-transition of surfaces is expected to contribute not only to this heat transfer subject but to the development of new in-process surface diagnosis techniques, since the radiation phenomena respond well to the same size-order span of microstructure as that of the wavelength of radiation. We have developed a spectrophotometer system which measures the spectra of reflection and emission of radiation in the λ=0.30-11 μm wavelength region simultaneously with a cycle time of 2 s, and have investigated the dynamics of spectrum transition of real surfaces under physical/ chemical reaction processes. Also, we have presented an algorithm for analyzing the measured spectra at each time to diagnose the change of surface temperature T, average surface film thickness d, film interface roughness σ, and so on. This article reviews the present status and the idea of approach to the above problems by us and other scientists in related fields.