Inscrição na biblioteca: Guest

ISSN Online: 2377-424X

ISBN Print: 1-56032-797-9

International Heat Transfer Conference 11
August, 23-28, 1998, Kyongju, Korea

TEMPERATURE JUMP AT INTERFACE BETWEEN ADJACENT DIELECTRIC THIN FILMS

Get access (open in a dialog) DOI: 10.1615/IHTC11.210
pages 123-128

Resumo

The present work solves the EPRT in two adjacent dielectric thin films for different film/substrate combinations. An imaginary interface temperature is assumed to link the two adjacent films. It is found that the energy transmission at interface as well as the layer thickness are important parameters in determining the temperature jump at interface. Significant change in phonon mean free path due to grain-structure at interface does influence the jump significantly in terms of grain size and grain structure. The ratios of the temperature jumps al boundary surfaces of two films to the interface for each layer are only functions of the energy transmission coefficients and independent of the film thickness and the phonon mean free path.